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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Structure of submicrocrystalline materials studied by X-ray diffraction
 Matěj, Zdeněk ; Kužel, Radomír (advisor) ; Lukáš, Petr (referee) ; Čerňanský, Marian (referee)
Structure of submicrocrystalline materials was investigated by X-ray powder diffraction, mainly by modelling of widths and shapes of diffraction profiles. The diffraction method was applied to colloid gold nanoparticles, copper samples deformed by equal channel angular pressing and titanium dioxide nanoparticles prepared by various chemical routes. Dislocations and twin faults were identified in the metallic samples from characteristic broadening of diffraction lines. Densities of lattice defects were estimated from the diffraction data. Possibilities and limits of the diffraction method for characterisation of a crystallite size distribution were tested on the titanium dioxide samples. Crystallites of size in the range 3-25 nm could be well characterised. The problems were encountered only for samples with extremely broad size dispersion. Diffraction methods and a computer program were developed and tested, which can be applied also for the analysis of thin films.
Detailed record
Structure of submicrocrystalline materials studied by X-ray diffraction
 Matěj, Zdeněk ; Kužel, Radomír (advisor) ; Lukáš, Petr (referee) ; Čerňanský, Marian (referee)
Structure of submicrocrystalline materials was investigated by X-ray powder diffraction, mainly by modelling of widths and shapes of diffraction profiles. The diffraction method was applied to colloid gold nanoparticles, copper samples deformed by equal channel angular pressing and titanium dioxide nanoparticles prepared by various chemical routes. Dislocations and twin faults were identified in the metallic samples from characteristic broadening of diffraction lines. Densities of lattice defects were estimated from the diffraction data. Possibilities and limits of the diffraction method for characterisation of a crystallite size distribution were tested on the titanium dioxide samples. Crystallites of size in the range 3-25 nm could be well characterised. The problems were encountered only for samples with extremely broad size dispersion. Diffraction methods and a computer program were developed and tested, which can be applied also for the analysis of thin films.
Detailed record

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